The method for fabricating photocell based on two Schottky barrier contacts Al-p-Si and Ti-p-Si

Authors

  • Александр Иосифович Блесман Omsk State Technical University, Omsk, Russia https://orcid.org/0000-0003-2837-3469
  • Рудиарий Борисович Бурлаков F. M. Dostoevsky Omsk State University, Omsk, Russia

DOI:

https://doi.org/10.25206/1813-8225-2018-162-164-168

Keywords:

method of fabricating the photocell, p-type silicon, Schottky barrier contacts

Abstract

The task of studies is a development of the structure and way of the fabrication of the photocell capable to take a radiation or in near infrared region of the spectrum (1–1,4) microns, or in the field of (0,5–1,4) microns. The way of fabrication and results of studies of photoelectric features of two spectrum photocell based on two Schottky barrier contacts Al-p-Si and Ti-p-Si situated on opposite parties Si plate is considered. It is shown that removing violated layer on surface of the silicon plate leads to significant increase voltage of the idling and current of the short circuit of the contact Al-p-Si situated on this surface and illuminated through the silicon plate.


Downloads

Download data is not yet available.

Author Biographies

Александр Иосифович Блесман, Omsk State Technical University, Omsk, Russia

кандидат технических наук, доцент (Россия), заведующий кафедрой «Физика», директор научно-образовательного ресурсного центра «Нанотехнологии» Омского государственного технического университета.

Рудиарий Борисович Бурлаков, F. M. Dostoevsky Omsk State University, Omsk, Russia

кандидат физико-математических наук, доцент (Россия), доцент кафедры «Прикладная и медицинская физика» Омского государственного университета им. Ф. М. Достоевского.

Downloads


Abstract views: 7

Published

2019-01-18

How to Cite

[1]
Блесман, А.И. and Бурлаков, Р.Б. 2019. The method for fabricating photocell based on two Schottky barrier contacts Al-p-Si and Ti-p-Si. Omsk Scientific Bulletin. 6(162) (Jan. 2019), 164–168. DOI:https://doi.org/10.25206/1813-8225-2018-162-164-168.

Issue

Section

Instrument Engineering, Metrology and Information-Measuring Devices and Systems

Similar Articles

You may also start an advanced similarity search for this article.