Photocells based on silicide Schottky barrier contacts PtSi-n-Si and PdSi-n-Si

Authors

  • Александр Иосифович Блесман Omsk State Technical University, Omsk, Russia https://orcid.org/0000-0003-2837-3469
  • Рудиарий Борисович Бурлаков Dostoevsky Omsk State University, Omsk, Russia

DOI:

https://doi.org/10.25206/1813-8225-2019-163-50-54

Keywords:

method of fabricating the photocell, n-type silicon, Schottky barrier contacts PtSi-n-Si (or PdSi-n-Si)

Abstract

Task of studies is a development of the structure and way of fabrication of a photocell capable to take a radiation or in
near infrared range of the spectrum (0,9–1,4) micron, or in the field of (0,5–1,4) micron. Way of fabrication and results of studies of photoelectric features of two spectrum photocells based on two Schottky barrier contacts PtSi-n-Si (or PdSi-n- Si), situated on opposite parties silicon plate, are сonsidered. It is shown that the explored photocell can be used for the transformation of the energy of the radiation in the electrical energy at room temperature in two ranges: or in near infrared region of the spectrum (0,9–1,4) micron, or in the field of (0,5–1,4) micron. This characteristic of the designed photocell
will allow to increase its application. Photocell possesses a simple structure and technology with a time of its fabrication
in the interval (2,5–3) of the hour.

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Author Biographies

Александр Иосифович Блесман, Omsk State Technical University, Omsk, Russia

кандидат технических наук, доцент (Россия), заведующий кафедрой «Физика», директор научно-образовательного ресурсного центра «Нанотехнологии» Омского государственного технического университета.

Рудиарий Борисович Бурлаков, Dostoevsky Omsk State University, Omsk, Russia

кандидат физико-математических наук, доцент (Россия), доцент кафедры «Прикладная и медицинская физика» Омского государственного университета им. Ф. М. Достоевского.

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Abstract views: 12

Published

2019-03-15

How to Cite

[1]
Блесман, А.И. and Бурлаков, Р.Б. 2019. Photocells based on silicide Schottky barrier contacts PtSi-n-Si and PdSi-n-Si. Omsk Scientific Bulletin. 1(163) (Mar. 2019), 50–54. DOI:https://doi.org/10.25206/1813-8225-2019-163-50-54.

Issue

Section

Instrument Engineering, Metrology and Information-Measuring Devices and Systems

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