Study of the charge transfer process in the polyaniline/graphite heterojunction by conductive atomic force microscopy

Authors

DOI:

https://doi.org/10.25206/1813-8225-2020-173-94-98

Keywords:

polyaniline, graphite, heterojunction, conductive atomic force microscopy, potential barrier width

Abstract

Thin layers of polyaniline on the surface of highly oriented pyrolytic graphite are obtained by in-situ chemical oxidative polymerization of aniline. The current-voltage characteristics of the tip/polyaniline/graphite contact, which have a form characteristic of tunnel contacts, have been measured by the method of conducting atomic force microscopy. By modeling the current-voltage characteristics using the Simmons model, the width of the potential barrier is determined, which for the investigated heterojunction is 0,5 nm.

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Author Biographies

Надим Анварович Давлеткильдеев, Omsk Scientific Center of Siberian Branch of Russian Academy of Sciences, Omsk, Russia

кандидат физико-математических наук, доцент (Россия), старший научный сотрудник лаборатории физики наноматериалов и гетероструктур.

Евгений Юрьевич Мосур, Omsk Scientific Center of Siberian Branch of Russian Academy of Sciences, Omsk, Russia

кандидат физико-математических наук, доцент (Россия), старший научный сотрудник лаборатории физики наноматериалов и гетероструктур.

Денис Витальевич Соколов, Omsk Scientific Center of Siberian Branch of Russian Academy of Sciences, Omsk, Russia

младший научный сотрудник лаборатории физики наноматериалов и гетероструктур.

Иван Андреевич Лобов, Omsk Scientific Center of Siberian Branch of Russian Academy of Sciences, Omsk, Russia

младший научный сотрудник лаборатории физики наноматериалов и гетероструктур.

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Abstract views: 9

Published

2020-11-30

How to Cite

[1]
Давлеткильдеев, Н.А., Мосур, Е.Ю., Соколов, Д.В. and Лобов, И.А. 2020. Study of the charge transfer process in the polyaniline/graphite heterojunction by conductive atomic force microscopy. Omsk Scientific Bulletin. 5(173) (Nov. 2020), 94–98. DOI:https://doi.org/10.25206/1813-8225-2020-173-94-98.

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Section

Instrument Engineering, Metrology and Information-Measuring Devices and Systems

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