Study of the charge transfer process in the polyaniline/graphite heterojunction by conductive atomic force microscopy
DOI:
https://doi.org/10.25206/1813-8225-2020-173-94-98Keywords:
polyaniline, graphite, heterojunction, conductive atomic force microscopy, potential barrier widthAbstract
Thin layers of polyaniline on the surface of highly oriented pyrolytic graphite are obtained by in-situ chemical oxidative polymerization of aniline. The current-voltage characteristics of the tip/polyaniline/graphite contact, which have a form characteristic of tunnel contacts, have been measured by the method of conducting atomic force microscopy. By modeling the current-voltage characteristics using the Simmons model, the width of the potential barrier is determined, which for the investigated heterojunction is 0,5 nm.
Downloads
Published
How to Cite
Issue
Section
License
Non-exclusive rights to the article are transferred to the journal in full accordance with the Creative Commons License BY-NC-SA 4.0 «Attribution-NonCommercial-ShareAlike 4.0 Worldwide License (CC BY-NC-SA 4.0»)