Improving air monitoring system in the city

Authors

DOI:

https://doi.org/10.25206/1813-8225-2020-171-80-85

Keywords:

air pollution, atmospheric monitoring, search for the source of pollution, excess emission, localization of the source of pollution

Abstract

Despite the fact that the majority of large industrial enterprises in Omsk comply with environmental legislation, the problem of air pollution is acute in the city. The expansion of the network of air pollution observation posts allows us to improve the quality of determining background pollution, but it is not able to answer the question of who is to blame for excess air pollution. The
article presents the development aimed at improving the existing monitoring system, which allows, on the one hand, to determine the level of pollution at any point in the area, and, on the other hand, to quickly respond to complaints from the population about the violation of atmospheric air quality and identify sources of excess emissions in the city.

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Author Biographies

Лев Оттович Штриплинг, Omsk State Technical University, Omsk, Russia

доктор технических наук, профессор (Россия), заведующий кафедрой «Промышленная экология и безопасность», проректор по учебно-методической работе.

Владислав Викторович Баженов, Omsk State Technical University, Omsk, Russia

кандидат технических наук, доцент кафедры «Промышленная экология и безопасность».

Наталья Сергеевна Баженова, Omsk State Technical University, Omsk, Russia

аспирант, ассистент кафедры «Промышленная экология и безопасность».

Полина Евгеньевна Нор, Omsk State Technical University, Omsk, Russia

кандидат химических наук, доцент кафедры «Промышленная экология и безопасность».

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Abstract views: 13

Published

2020-06-30

How to Cite

[1]
Штриплинг, Л.О., Баженов, В.В., Баженова, Н.С. and Нор, П.Е. 2020. Improving air monitoring system in the city. Omsk Scientific Bulletin. 3(171) (Jun. 2020), 80–85. DOI:https://doi.org/10.25206/1813-8225-2020-171-80-85.

Issue

Section

Instrument Engineering, Metrology and Information-Measuring Devices and Systems

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