Devices for express diagnostics of power semiconductor devices and semiconductor converters

Authors

  • Elena Borisovna Koroleva Emperor Alexander I St. Petersburg State Transport University, Saint Petersburg, Russia
  • Sergey Mikhaylovich Kurmashev Emperor Alexander I St. Petersburg State Transport University, Saint Petersburg, Russia
  • Konstantin Konstantinovich Kim Emperor Alexander I St. Petersburg State Transport University, Saint Petersburg, Russia
  • Anton Andreyevich Tkachuk Emperor Alexander I St. Petersburg State Transport University, Saint Petersburg, Russia
  • Andrey Albertovich Kuznetsov Omsk State Transport University, Omsk, Russia

DOI:

https://doi.org/10.25206/1813-8225-2023-186-119-125

Keywords:

semiconductor device, express diagnostics, reverse current, communication resistors, analog-to-digital converter, methodical measurement error

Abstract

The increase in the power of power semiconductor converters operated in the railway industry is associated with the use of group connections of power semiconductor devices in them, the variation in the parameters of which, and, therefore, their unequal load, causes a decrease in the reliability of the power semiconductor converters as a whole. In this regard, it becomes necessary to develop and implement innovative methods and devices for express diagnostics in order to identify potentially unreliable semiconductor devices, and the implementation of technical diagnostics should not be associated with dismantling the electrical circuits of the converters. The method is proposed for determining potentially unreliable power semiconductor devices in group connections based on the results of analyzing the distribution of reverse currents in parallel branches, which made it possible to create a series of devices for diagnosing power semiconductor devices in converters, both with and without communication resistors. The methodological error of measurements made using the developed express diagnostics devices of the transducers do not exceed the standard value equal to 10 %.

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Author Biographies

Elena Borisovna Koroleva, Emperor Alexander I St. Petersburg State Transport University, Saint Petersburg, Russia

Candidate of Technical Sciences, Associate Professor, Associate Professor of Electrical Engineering and Heat Power Engineering Department, Emperor Alexander I St. Petersburg State Transport University (PGUPS), Saint Petersburg.

Sergey Mikhaylovich Kurmashev, Emperor Alexander I St. Petersburg State Transport University, Saint Petersburg, Russia

Candidate of Technical Sciences, Associate Professor, Saint Petersburg.

Konstantin Konstantinovich Kim, Emperor Alexander I St. Petersburg State Transport University, Saint Petersburg, Russia

Doctor of Technical Sciences, Professor, Head of Electrical Engineering and Heat Power Engineering Department, PGUPS, Saint Petersburg.

Anton Andreyevich Tkachuk, Emperor Alexander I St. Petersburg State Transport University, Saint Petersburg, Russia

Candidate of Technical Sciences, Associate Professor of Electrical Engineering and Heat Power Engineering Department, PGUPS, Saint Petersburg.

Andrey Albertovich Kuznetsov, Omsk State Transport University, Omsk, Russia

Doctor of Technical Sciences, Professor, Head of Theoretical Electrical Engineering Department, Omsk State Transport University, Omsk.

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Abstract views: 61

Published

2023-06-14

How to Cite

[1]
Koroleva Е.Б., Kurmashev С.М., Kim К.К., Tkachuk А.А. and Kuznetsov А.А. 2023. Devices for express diagnostics of power semiconductor devices and semiconductor converters. Omsk Scientific Bulletin. 2(186) (Jun. 2023), 119–125. DOI:https://doi.org/10.25206/1813-8225-2023-186-119-125.

Issue

Section

Energy and Electrical Engineering

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