Study of electroinductive disk sensor of electric field strength

Authors

DOI:

https://doi.org/10.25206/1813-8225-2023-186-134-139

Keywords:

electric field, homogeneous field, inhomogeneous field, point source, intensity, disk sensor, error from field inhomogeneity, electrometric measurements

Abstract

Tasks related to the protection of biological and technical objects from the effects of electrical are relevant. One of these tasks is related to the development of electric field strength sensors with specified metrological characteristics. The aim of the study is to minimize the error of the known sensor and expand its spatial measurement range due to the rational choice of sensitive elements. The sensor
proposed in the work has a negative error  from the field inhomogeneity modulo no more than 3 % in the spatial measurement range 0aR, where R is the radius
of the disk base of the sensor. To ensure the required metrological characteristics of the sensor, rational dimensions of its sensitive elements are selected. In this case, the rational radius r of the sensing elements made in the shape of a circle must satisfy the condition r<R, i.e. it must be less than the radius R of the disk base of the sensor. If this condition is met, a smaller radius r of the sensing element will correspond to a smaller error  from the inhomogeneity of the field and a larger spatial measurement range. In comparison with known sensors, with the same error, the proposed sensor has a spatial measurement range approximately five times larger. This approach to the selection of sensitive elements allows us to design sensors with the best metrological characteristics.

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Author Biography

Sergey Vladimirovich Biryukov, Omsk State Technical University, Omsk, Russia

Doctor of Technical Sciences, Professor, Professor of Physics Department, Omsk State Technical University, Omsk.

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Abstract views: 15

Published

2023-06-14

How to Cite

[1]
Biryukov С.В. 2023. Study of electroinductive disk sensor of electric field strength. Omsk Scientific Bulletin. 2(186) (Jun. 2023), 134–139. DOI:https://doi.org/10.25206/1813-8225-2023-186-134-139.

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Section

Electronics, Photonics, Instrument Engineering and Connection