Determination of electrical parameters of individual multiwalled carbon nanotube using scanning probe microscopy techniques

Authors

  • Денис Витальевич Соколов Omsk Scientific Center of the Siberian Branchof the Russian Academy of Sciences, Omsk, Russia
  • Надим Анварович Давлеткильдеев Omsk Scientific Center of the Siberian Branchof the Russian Academy of Sciences, Omsk, Russia
  • Иван Андреевич Лобов Omsk Scientific Center of the Siberian Branchof the Russian Academy of Sciences, Omsk, Russia

DOI:

https://doi.org/10.25206/1813-8225-2018-159-114-117

Keywords:

carbon nanotubes, conductive atomic force microscopy, electrostatic force microscopy, electrical parameters, work function, conductivity

Abstract

Based on the combination of conductive atomic force microscopy (C-AFM) and electrostatic force microscopy (EFM), the electrical parameters of undoped, nitrogen- and boron-doped individual multiwalled carbon nanotubes (CNTs) have been determined. The longitudinal electric resistance of CNTs is obtained using C-AFM. The determination of diameter, length and work function in CNT is based on the analysis of EFM data. Using two techniques of scanning probe microscopy, electrical conductivity, free carriers concentration, carriers mobility of individual multiwalled CNT are evaluated.

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Author Biographies

Денис Витальевич Соколов, Omsk Scientific Center of the Siberian Branchof the Russian Academy of Sciences, Omsk, Russia

младший научный сотрудник лаборатории физики наноматериалов и гетероструктур.

Надим Анварович Давлеткильдеев, Omsk Scientific Center of the Siberian Branchof the Russian Academy of Sciences, Omsk, Russia

кандидат физико-математических наук, доцент (Россия), старший научный сотрудник лаборатории физики наноматериалов и гетероструктур.

Иван Андреевич Лобов, Omsk Scientific Center of the Siberian Branchof the Russian Academy of Sciences, Omsk, Russia

инженер-технолог лаборатории физики наноматериалов и гетероструктур.

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Abstract views: 15

Published

2018-07-04

How to Cite

[1]
Соколов, Д.В., Давлеткильдеев, Н.А. and Лобов, И.А. 2018. Determination of electrical parameters of individual multiwalled carbon nanotube using scanning probe microscopy techniques. Omsk Scientific Bulletin. 3(159) (Jul. 2018), 114–117. DOI:https://doi.org/10.25206/1813-8225-2018-159-114-117.

Issue

No. 3(159) (2018)

Section

Instrument Engineering, Metrology and Information-Measuring Devices and Systems

License

Non-exclusive rights to the article are transferred to the journal in full accordance with the Creative Commons License BY-NC-SA 4.0 «Attribution-NonCommercial-ShareAlike 4.0 Worldwide License (CC BY-NC-SA 4.0»)

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