Features of contacting of transparent and high-strength measuring tips of active control devices of sizes with products during process of their grinding

Authors

  • Евгений Владимирович Леун Lavochkin Association, Moscow region, Khimki, Russia
  • Владимир Исидорович Леун Omsk State Technical University, Omsk, Russia

DOI:

https://doi.org/10.25206/1813-8225-2018-160-134-139

Keywords:

active control, contact measurements, non-contact measurements, product size, corundum, sapphire, tip

Abstract

The article is devoted to the analysis of the load capacity of measuring tips of active control devices (ACD) with the size of the
products in their mechanical contact. The value of the depth of indentation of the measuring tips into the product is calculated,
which leads to the formation of measurement error. Transparent and high-strength materials for the manufacture of measuring tips are considered. The mode of mechanical interaction for experimental studies of the features of contact between the sapphire tip and the highspeed steel cutter is determined and the value of the specific energy in this contact is calculated. It is shown that the resulting loads, having a ≈40 fold safety margin and corresponding to the quasi-plasticity regime, do not lead to brittle fracture.

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Author Biographies

Евгений Владимирович Леун, Lavochkin Association, Moscow region, Khimki, Russia

кандидат технических наук, ведущий инженер АО «НПО Лавочкина».

Владимир Исидорович Леун, Omsk State Technical University, Omsk, Russia

доктор технических наук, профессор секции «Метрология и приборостроение» кафедры «Нефтегазовое дело, стандартизация и метрология» Омского государственного технического университета.

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Abstract views: 11

Published

2018-09-20

How to Cite

[1]
Леун, Е.В. and Леун, В.И. 2018. Features of contacting of transparent and high-strength measuring tips of active control devices of sizes with products during process of their grinding. Omsk Scientific Bulletin. 4(160) (Sep. 2018), 134–139. DOI:https://doi.org/10.25206/1813-8225-2018-160-134-139.

Issue

Section

Instrument Engineering, Metrology and Information-Measuring Devices and Systems